RMQSI Knowledge CenterDATA CALLField Failure Rate Data for Electronic Components
The RMQSI Knowledge Center™, operated by Quanterion Solutions, is currently working to update the Electronic Parts Reliability Data (EPRD-2014) databook, and the component models for its 217Plus™:2015 System Reliability Assessment methodology. We are inviting our user community to assist us by providing quantitative field failure rate… Read More
Quanterion Solutions, AIS, ANDRO, Harris Corporation and NUAIR provided state-of-the-art expertise to area students as part of two-day science, technology, engineering and mathematics (STEM) program at The Beeches on October 18th and 19th.
John Reade, a Quanterion Computer Scientist, demonstrated unmanned aircraft systems (UAS) “drone” projects currently being performed for the Air Force Research Laboratory (AFRL)… Read More
Recent contract awards approaching $7M means new hires for Quanterion Solutions, a Utica-based small business performing R&D and consulting services for the Government and industry. Key hires include cybersecurity experts Roderick Nettles and Cully Patch, retired Air Force officers returning to the area where they had previous assignments at the Eastern Air Defense Sector (EADS)… Read More
This workshop is now closed.
Come Join Us for a FREE one-day
“Introduction to Reliability Centered Maintenance”
Training Workshop
Seating is limited to the first 35 individuals
Date:
Thursday, July 14, 2016
Time:
8:30 am. to 4:30 p.m.
Hosted By:
Quanterion Solutions Incorporated
Location:
CASE: The Center for Advanced Systems and Engineering
Syracuse University
2-212 CST
Syracuse, NY 13244
Course Description:
This one-day course provides a general introduction to Reliability-Centered Maintenance (RCM),… Read More
The NanoTech Connect Website provides:
Centralized nanotechnology, nanoscience and nanoengineering resources for researchers, engineers, administrators and students
Promotion of technical, industry, administrative and government organizations in New York State and across the country
Read more….
If you would like to subscribe to our NanoTech Connect distribution list to receive all the latest news and announcements, click… Read More
Quanterion Solutions, in collaboration with noted domain expert Kenneth P. LaSala, PhD, is proud to announce the availability of the Second Edition of his “A Practical Guide to Developing Reliable Human-Machine Systems” publication. This publication has four objectives:
Motivate designers to consider the impact of humans early in the development of systems and processes, when the… Read More
Quanterion Solutions’ Stress-Derating Spreadsheet Calculator – ECSS-Q-ST-30-11C Revision 1 Derating Standard is an Excel®-based software tool that allows the user to easily determine if a design is in compliance with the derating guidelines presented in the European Cooperation for Space Standardization document:
ECSS-Q-ST-30-11C Rev 1 – Derating – EEE components (4 October 2011)
After selecting the application environment… Read More
As part of an ongoing Core Analysis Task (CAT), the CSIAC successfully completed the static testing of an Autonomous Unmanned Aerial Systems (UAS) Experimentation System (AUES) for autonomous UAS Command and Control (C2). In addition, the CSIAC team also completed pilot training in preparation for the live flight testing of the Lockheed Martin Desert Hawk… Read More
The RMQSI Knowledge Center announces a new format in its popular reliability databook series of publications for those who prefer electronic media. The Databook Automated Text Reader provides a searchable text viewing capability for our NPRD-2016, FMD-2016 and EPRD-2014 Databooks as individual product offerings, or in any combination.
Confidence Bounds on the Mean Time Between Failure (MTBF) for a Time-Truncated Test
There is a long standing discussion on how best to calculate the lower and upper confidence bounds on the Mean Time Between Failure (MTBF) for a time-truncated test (Type I Censoring) assuming that the times between failure are exponentially distributed (constant failure rate).… Read More
