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Quanterion Virtual Bookstore Table Of Contents
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The 'Bookstore' represents a collection of thousands of valuable US Government research reports, standards, handbooks, and other references on reliability, maintainability, and quality, as well as related topics (such as interoperability, supportability, logistics, and quality), brought together in one handy, searchable location.
Military standards and handbooks are available in Adobe PDF format for
FREE
download. Research reports, available in PDF format for download or in hard copy format, are priced as indicated. If you do not have the Adobe PDF reader, go to
http://adobe.com
to download a free copy.
Click on a title to view the citation.
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| 3451. | MATHEMATICAL METHODS OF RESOURCE ALLOCATION FOR OPTIMIZING RELIABILITY. |
| 3452. | RELIABILITY EVALUATION OF PROGRAMMABLE READ-ONLY MEMORIES (PROMS). |
| 3453. | BAYESIAN ANALYSIS OF RELIABILITY IN MULTICOMPONENT STRESS-STRENGTH MODELS. |
| 3454. | DAMAGE PROFILES IN SILICON AND THEIR IMPACT ON DEVICE RELIABILITY. |
| 3455. | RELIABILITY EVALUATION OF SEMICONDUCTOR MEMORIES. |
| 3456. | PRODUCTION ENGINEERING MEASURE FOR IMPROVED RELIABILITY OF METALLIZED POLYCARBONATE AND METALLIZED POLYSULFONE CAPACITORS. |
| 3457. | RELIABILITY GROWTH STUDY. |
| 3458. | RELIABILITY DESIGN HANDBOOK, |
| 3459. | RELIABILITY OF DEPOSITED GLASS. |
| 3460. | INTEREXAMINER RELIABILITY OF A SIMPLIFIED CARIES INDEX. |
| 3461. | DAMAGE PROFILES IN SILICON AND THEIR IMPACT ON DEVICE RELIABILITY. PARTII. |
| 3462. | RELIABILITY EVALUATION OF C/MOS TECHNOLOGY IN COMPLEX INTEGRATED CIRCUITS. |
| 3463. | HELICOPTER RELIABILITY GROWTH EVALUATION. |
| 3464. | RELIABILITY METHODOLOGY AND PROCEDURES. |
| 3465. | FURTHER DEVELOPMENT OF RELIABILITY ANALYSIS APPLICATION TO STRUCTURAL FATIGUE EVALUATION. |
| 3466. | IMPROVEMENT OF RELIABILITY AND THE MECHANICAL PROPERTIES OF TITANIUM ALLOY FORGINGS. |
| 3467. | CURRENT PRACTICE ON ESTIMATING CRACK GROWTH DAMAGE ACCUMULATION WITH SPECIFIC APPLICATION TO STRUCTURAL SAFETY DURABILITY AND RELIABILITY. |
| 3468. | RELIABILITY, AVAILABILITY, AND MAINTAINABILITY ANALYSIS OF THE LSAAP 105MM ASSEMBLY LINE. |
| 3469. | ON THE RELIABILITY OF FIELD MEASUREMENTS OF SALINITY WITH THE INDUCTIVE SALINOMETER. |
| 3470. | REFLECTIVE COATINGS RELIABILITY STUDY. |
| 3471. | RELIABILITY EVALUATION OF MNOS ARRAYS. |
| 3472. | FAA LIGHTNING PROTECTION STUDY: RELIABILITY LIFE OF LIGHTNING PROTECTION DEVICES UNDER SIMULATED LIGHTNING CONDITIONS. |
| 3473. | MONTE CARLO BAYESIAN SYSTEM RELIABILITY- AND MTBF-CONFIDENCE ASSESSMENT. |
| 3474. | IMPROVING THE RELIABILITY OF FACTOR ANALYSIS OF CHEMICAL DATA BY UTILIZING THE MEASURED ANALYTICAL UNCERTAINTY. |
| 3475. | STORAGE RELIABILITY OF MISSILE MATERIEL PROGRAM: RELAY ANALYSIS. |
| 3476. | STORAGE RELIABILITY OF MISSILE MATERIEL PROGRAM: GYROSCOPE ANALYSIS. |
| 3477. | STORAGE RELIABILITY OF MISSILE MATERIEL PROGRAM: ACCELEROMETER ANALYSIS. |
| 3478. | STORAGE RELIABILITY OF MISSILE MATERIEL PROGRAM: SWITCH ANALYSIS. |
| 3479. | HIGH RELIABILITY, LOW COST INTEGRATED CIRCUITS. |
| 3480. | STORAGE RELIABILITY OF MISSILE MATERIEL PROGRAM. MISSILE HYDRAULIC AND PNEUMATIC SYSTEMS ACTUATOR ANALYSIS. |
| 3481. | RELIABILITY TEST FOR IMAGE INTENSIFIER ASSEMBLY, 25 MILLIMETER MICROCHANNEL INVERTER. |
| 3482. | STORAGE RELIABILITY OF MISSILE MATERIEL PROGRAM. SOLID PROPELLANT GAS GENERATORS ANALYSIS. |
| 3483. | AMSAA RELIABILITY GROWTH SYMPOSIUM (2ND) 12-13 NOVEMBER 1974. |
| 3484. | THE EFFECTS OF SUBSTRATE COMPOSITION ON THICK FILM CIRCUIT RELIABILITY. |
| 3485. | ENGINEERING DESIGN HANDBOOK. DEVELOPMENT GUIDE FOR RELIABILITY. PART SIX. MATHEMATICAL APPENDIX AND GLOSSARY. |
| 3486. | RELIABILITY: POLICY VERSUS IMPLEMENTATION. |
| 3487. | RELIABILITY PREDICTION FOR MICROWAVE TRANSISTORS. |
| 3488. | RELIABILITY AND MAINTAINABILITY VS. FLEET READINESS. |
| 3489. | IDENTIFICATION OF CRITICAL FAILURES AND COST EFFECTIVE RELIABILITY IMPROVEMENT APPROACHES. |
| 3490. | RELIABILITY TESTS AND ANALYSIS OF CMOS NOR GATES WITH APPLICATION OF NEMATIC LIQUID CRYSTAL FAILURE ANALYSIS TECHNIQUES, |
| 3491. | THE PHYSICS OF RELIABILITY OF FUTURE ELECTRONIC DEVICES. |
| 3492. | RELIABILITY EVALUATION OF ECL MICROCIRCUITS. |
| 3493. | APPLICATION OF BAYESIAN TECHNIQUES TO RELIABILITY DEMONSTRATION, ESTIMATION AND UPDATING OF THE PRIOR DISTRIBUTION. |
| 3494. | RELIABILITY PREDICTION FOR MECHANICAL SYSTEMS. |
| 3495. | RELIABILITY OF NONDESTRUCTIVE INSPECTIONS. |
| 3496. | MULTISTATE RELIABILITY MODELS. |
| 3497. | STUDY OF THE PHYSICS OF INSULATING FILMS AS RELATED TO THE RELIABILITY OF METAL-OXIDE SEMICONDUCTOR DEVICES. |
| 3498. | MERADCOM/OSU HYDRAULIC SYSTEM RELIABILITY PROGRAM. |
| 3499. | EXTENSIONS OF A SIMPLE MODEL WITH APPLICATIONS IN RELIABILITY, EXTINCTION OF SPECIES, INVENTORY DEPLETION AND URN SAMPLING. |
| 3500. | 217B PREDICT, SYSTEM RELIABILITY PREDICTION COMPUTER PROGRAM. VOLUME I. USER MANUAL. |
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