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    Quanterion Virtual Bookstore Table Of Contents
 


The 'Bookstore' represents a collection of thousands of valuable US Government research reports, standards, handbooks, and other references on reliability, maintainability, and quality, as well as related topics (such as interoperability, supportability, logistics, and quality), brought together in one handy, searchable location.

Military standards and handbooks are available in Adobe PDF format for FREE download. Research reports, available in PDF format for download or in hard copy format, are priced as indicated. If you do not have the Adobe PDF reader, go to http://adobe.com to download a free copy.



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3401.RELIABILITY, VALIDITY AND APPLICATION OF AN IMPROVED SCALE FOR ASSESSMENT OF MOTION SICKNESS SEVERITY.
3402.XM1 TANK'S RELIABILITY IS STILL UNCERTAIN.
3403.A COMBINED ENVIRONMENTS RELIABILITY TEST (CERT) FACILITY FOR TESTING OF AIRBORNE EQUIPMENT.
3404.PHASE II FINAL DEVELOPMENT REPORT FOR HIGH-RELIABILITY, LOW-COST INTEGRATED CIRCUITS.
3405.ESTIMATING THE SYSTEM RELIABILITY LOWER CONFIDENCE LIMIT FROM DATA DERIVED FROM SYSTEM AND SUBSYSTEM TEST RESULTS.
3406.AN ADAPTIVE BAYESIAN SCHEME FOR ESTIMATING RELIABILITY GROWTH UNDER EXPONENTIAL FAILURE TIMES.
3407.MICROCIRCUIT DEVICE RELIABILITY HYBRID CIRCUIT DATA, WINTER 1979/1980,
3408.DISCRETE SEMICONDUCTOR RELIABILITY TRANSISTOR/DIODE DATA, WINTER 79/80,
3409.BUILT-IN-TEST AND EXTERNAL TESTER RELIABILITY CHARACTERISTICS.
3410.RELIABILITY AND MAINTAINABILITY IMPROVEMENT PROGRAM FOR THE AV-8A HARRIER HEAD-UP DISPLAY SET. VOLUME I. MODIFICATIONS TO DIGITAL DISPLAY INDICATOR, IP-1351/AVQ-30(V).
3411.RELIABILITY AND MAINTAINABILITY IMPROVEMENT PROGRAM FOR THE AV-8A/TAV-8AHARRIER HEAD-UP DISPLAY SET. VOLUME II. MODIFICATIONS TO DISPLAY SET CONTROL, C10626/AVQ-30(V).
3412.SONAR TRANSDUCER RELIABILITY IMPROVEMENT PROGRAM FY 80.
3413.SONAR TRANSDUCER RELIABILITY IMPROVEMENT PROGRAM (STRIP) FY80.
3414.SOME BAYES ESTIMATORS OF RELIABILITY FOR THE INVERSE GAUSSIAN LIFETIME MODEL.
3415.ON ESTIMATION OF RELIABILITY FOR THE BIRNBAUM-SAUNDERS FATIGUE LIFE MODEL.
3416.AN ACCURACY ANALYSIS OF THE ARMY MATERIEL SYSTEM ANALYSIS ACTIVITY RELIABILITY GROWTH MODEL.
3417.EXPERIMENTAL EVALUATION OF A RELIABILITY ASSESSMENT MODEL FOR ADHESIVELYBONDED JOINTS.
3418.PRODUCTION ENGINEERING MEASURE FOR IMPROVED RELIABILITY OF METALLIZED POLYCARBONATE AND METALLIZED POLYSULFONE CAPACITORS.
3419.RELIABILITY AND BIOMETRY: STATISTICAL ANALYSIS OF LIFELENGTH,
3420.STUDY OF RELIABILITY PREDICTION TECHNIQUES FOR CONCEPTUAL PHASES OF DEVELOPMENT.
3421.THE PHYSICS OF INTERFACE INTERACTIONS RELATED TO RELIABILITY OF FUTURE ELECTRONICS DEVICES.
3422.REVISION OF RADC NONELECTRONIC RELIABILITY NOTEBOOK (RADC-TR-69-458, SECTION 2).
3423.ON THE EVALUATION OF RELIABILITY AND SECURITY MEASURES IN A COMPUTER NETWORK.
3424.ANALYSIS OF THE DAMAGEABILITY OF EIGHT-AXLE OPEN FREIGHT CARS AND SOME MEASURES FOR INCREASING THE RELIABILITY OF THEIR UNITS,
3425.RELIABILITY STUDY OF MICROWAVE TRANSISTOR PACKAGING.
3426.NAVY RELIABILITY AND MAINTAINABILITY POLICY STUDY.
3427.APPLICATION OF RELIABILITY IMPROVEMENT WARRANTY (RIW) TO DOD PROCUREMENTS.
3428.POWER TRANSISTOR RELIABILITY INVESTIGATION.
3429.RELIABILITY OF INTERCONNECTIONS ON MICROCIRCUITS.
3430.DAMAGE PROFILES IN SILICON AND THEIR IMPACT ON DEVICE RELIABILITY.
3431.URC-78 ( ) PHASE I. ULTRA RELIABLE LIGHTWEIGHT VHF-FM RADIO SYSTEM - RELIABILITY PROGRAM PLAN.
3432.MULTI-PHASE-MISSION RELIABILITY OF MAINTAINED SYSTEMS.
3433.DUANE'S RELIABILITY GROWTH MODEL AS A NONHOMOGENEOUS POISSON PROCESS.
3434.RELIABILITY ANALYSIS OF THE 9020A AND 9020D CENTRAL COMPUTER COMPLEX AT THE NATIONAL AVIATION FACILITIES EXPERIMENTAL CENTER.
3435.RELIABILITY EFFECTS ON MULTI-MISSION RPV MAINTENANCE.
3436.STOCHASTIC COMPARISONS OF ORDER STATISTICS FROM HETEROGENEOUS POPULATIONS, WITH APPLICATIONS IN RELIABILITY.
3437.AN/URC-78(XE-2)/V RADIO SET. RELIABILITY PREDICTION ANALYSIS REPORT ANDRELIABILITY MATHEMATICAL MODELS.
3438.RELIABILITY PROGRAM PLAN. ULTRA RELIABLE LIGHTWEIGHT VHF FM RADIO SYSTEM.
3439.SENSITIVITY ANALYSIS OF THE BAYESIAN ESTIMATORS OF THE INTENSITY PARAMETER AND RELIABILITY FUNCTION OF THE POISSON FAILURE MODEL.
3440.ROBUSTNESS STUDIES FOR BAYESIAN DEVELOPMENTS IN RELIABILITY.
3441.RELIABILITY STUDY OF MICROWAVE TRANSISTOR PACKAGING.
3442.SOME CURRENT ACADEMIC RESEARCH IN SYSTEM RELIABILITY THEORY.
3443.RELIABILITY EVALUATION OF POLYMER COATED MULTI-CHIP MULTI-LEVEL MICROELECTRONIC ASSEMBLIES.
3444.DESIGN AND ANALYSIS OF FIXED TIME RELIABILITY DEMONSTRATION TESTS.
3445.RELIABILITY ASSESSMENT FOR HIGHLY RELIABLE SYSTEMS.
3446.RELIABILITY ANALYSIS OF MICROCIRCUIT FAILURES IN AVIONIC SYSTEMS (RAMFAS).
3447.FAILURE STUDY AND RELIABILITY CONSIDERATIONS FOR RTE DESIGN VERIFICATIONMODELS.
3448.MULTI-PHASE-MISSION RELIABILITY OF MAINTAINED STANDBY SYSTEMS.
3449.USE OF OFF-THE-SHELF ELECTRONIC TEST EQUIPMENT TO REDUCE COSTS, SHORTEN LEAD-TIMES, ASSURE RELIABILITY, AND SIMPLIFY LOGISTICS.
3450.TEST DESIGN PLAN FOR BASELINE ARMOR RELIABILITY TEST.

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