The 'Bookstore' represents a collection of thousands of valuable US Government research reports, standards, handbooks, and other references on reliability, maintainability, and quality, as well as related topics (such as interoperability, supportability, logistics, and quality), brought together in one handy, searchable location. Military standards and handbooks are available in Adobe PDF format for FREE download. Research reports, available in PDF format for download or in hard copy format, are priced as indicated. If you do not have the Adobe PDF reader, go to http://adobe.com to download a free copy. Click on a title to view the citation. Previous 50   Next 50 2251. DEVELOPMENT OF SYSTEM/EQUIPMENT RELIABILITY CORPORATE MEMORY. 2252. RELIABILITY PREDICTION, ASSESSMENT AND GROWTH. 2253. STORAGE RELIABILITY OF MISSILE MATERIEL PROGRAM, ELECTRONIC VACUUM TUBE ANALYSIS. 2254. STORAGE RELIABILITY OF MISSILE MATERIEL PROGRAM, MISSILE SYSTEMS BATTERYANALYSIS. 2255. STORAGE RELIABILITY OF MISSILE MATERIEL PROGRAM, GYROSCOPE ANALYSIS. 2256. STORAGE RELIABILITY OF MISSILE MATERIEL PROGRAM, ACCELEROMETER ANALYSIS. 2257. STORAGE RELIABILITY OF MISSILE MATERIEL PROGRAM, RELAY ANALYSIS. 2258. STORAGE RELIABILITY OF MISSILE MATERIEL PROGRAM, SWITCH ANALYSIS. 2259. STORAGE RELIABILITY OF MISSILE MATERIEL PROGRAM, MONOLITHIC BIPOLAR SSI/MSI DIGITAL AND LINEAR INTEGRATED CIRCUIT ANALYSIS 2260. RELIABILITY PREDICTION OF THE AN/BQG-4 SONAR RECEIVING SET. 2261. RELIABILITY AND MAINTAINABILITY IMPROVEMENT PROGRAM FOR THE F-106 AVIONICS. 2262. DIGITAL AVIONICS INFORMATION SYSTEM (DAIS). VOLUME I. RELIABILITY AND MAINTAINABILITY MODEL. 2263. RELIABILITY FACTORS FOR ELECTRONIC COMPONENTS IN A STORAGE ENVIRONMENT 2264. A RELIABILITY GROWTH MODEL INVOLVING DEPENDENT COMPONENTS. 2265. A NEW LOOK AT THE ROLE OF CIRCUIT DESIGN ON ELECTRON DEVICE RELIABILITY. 2266. MICROCIRCUIT DEVICE RELIABILITY. DIGITAL FAILURE RATE DATA, 2267. MICROCIRCUIT DEVICE RELIABILITY. HYBRID CIRCUIT DATA, 2268. RELIABILITY IMPROVEMENT WARRANTIES FOR MILITARY PROCUREMENT. 2269. TRIP STEELS PROMISE HIGH RELIABILITY HARDWARE. 2270. RELIABILITY SYSTEMS WITH EXPONENTIAL SYSTEM LIFE AND IFRA COMPONENT LIVES. 2271. EFFECT OF PURITY ON RELIABILITY CHARACTERISTICS OF HIGH STRENGTH STEEL. 2272. NONPARAMETRIC METHODS WITH APPLICATIONS TO RELIABILITY. 2273. COMPREHENSIVE RESEARCH ON THE RELIABILITY AND PERFORMANCE OF SYSTEMS ANDCOMPONENTS ASSUMING MORE THAN TWO STATES. 2274. ACCELERATED TESTING ON THE RELIABILITY OF SEMI-CONDUCTOR ELEMENTS, 2275. STUDY OF THE PHYSICS OF INSULATING FILMS AS RELATED TO THE RELIABILITY OF METAL-OXIDE SEMICONDUCTOR DEVICES. 2276. ON A SELECTION PROBLEM IN RELIABILITY THEORY. 2277. THE EFFECTS OF SUBSTRATE COMPOSITION ON THICK FILM CIRCUIT RELIABILITY. 2278. ANALYTICAL HAZARD REPRESENTATION FOR USE IN RELIABILITY, MORTALITY, AND SIMULATION STUDIES. PART I. 2279. ANALYTICAL HAZARD REPRESENTATIONS FOR USE IN RELIABILITY, MORTALITY AND SIMULATION STUDIES. 2280. PERFORMANCE RATINGS: AN INVESTIGATION OF RELIABILITY, ACCURACY, AND RELATIONSHIPS BETWEEN INDIVIDUAL DIFFERENCES AND RATER ERROR. 2281. RELIABILITY, MAINTAINABILITY, AND AVAILABILITY CHARACTERISTICS OF 1527 BASELINE AND OTHER BASELINE CONFIGURATIONS OF RADAR SET AN/APG-59/AWG-10. VOLUMEII. APPENDIX B. DESCRIPTIONS OF THE ARINC RES 2282. MERADCOM/OSU HYDRAULIC SYSTEM RELIABILITY PROGRAM. 2283. PLAN FOR THE RELIABILITY AND MAINTAINABILITY EVALUATION OF THE DISCRETE ADDRESS BEACON SYSTEM (DABS) ENGINEERING LABORATORY MODELS, 2284. EFFECTS OF EMP TESTING ON SEMICONDUCTOR LONG TERM RELIABILITY. 2285. RELIABILITY STUDY OF GAAS FET. 2286. THE RELIABILITY OF WRITTEN REPORTS AND VERBAL INQUIRY IN ASSESSING MARITAL INTERACTIONS. 2287. SATCOM TERMINAL EHF/UHF TEST PROGRAM SYSTEM RELIABILITY ANALYSIS. 2288. PRODUCT-IMPROVEMENT TEST, MAINTAINABILITY AND RELIABILITY CHARACTERISTICS OF THE OH-58A HELICOPTER BETWEEN 1,200 AND 2,400 FLIGHT HOURS. 2289. A STUDY OF TRUNCATED SEQUENTIAL PROBABILITY RATIO TESTS FOR RELIABILITY TESTING AND SOME NEW RESULTS. 2290. HYBRID TECHNOLOGY COST REDUCTION AND RELIABILITY IMPROVEMENT STUDY. 2291. RELIABILITY APPLICATIONS OF MULTIVARIATE EXPONENTIAL DISTRIBUTIONS, DOWNTIME MODELING AND OPTIMAL REPLACEMENT OF DETERIORATING PARTS. 2292. INVESTIGATION OF RELIABILITY-GROWTH INCENTIVES AND ANALYSIS OF IOT AND ETEST DATA FOR AFSATCOM. 2293. DEVELOPMENT REPORT FOR HIGH-RELIABILITY, LOW-COST INTEGRATED CIRCUITS. 2294. RELIABILITY MONITORING FOR DEVELOPMENT PROJECTS. 2295. LIGHTWEIGHT PROPULSION SYSTEMS FOR ADVANCED NAVAL SHIP APPLICATIONS. PART II. CONCEPTUAL DESIGN AND RELIABILITY ANALYSIS. 2296. PERCEIVED JOB DESIGN CONSTRUCTS: RELIABILITY AND VALIDITY. 2297. KA-BAND RELIABILITY IMPROVEMENT. PART III. USER'S MANUAL FOR TASA/ DEPEND PROGRAM. 2298. RELIABILITY STUDY OF MICROWAVE POWER TRANSISTORS UNDER TRANSIENT AND MISMATCHED LOADS. 2299. THE RELIABILITY OF FLYING MACHINES AND ENVIRONMENTAL TESTINGS, 2300. A METHOD TO EVALUATE PERFORMANCE RELIABILITY OF INDIVIDUAL SUBJECTS IN LABORATORY RESEARCH APPLIED TO WORK SETTINGS, Previous 50   Next 50