Virtual Bookstore Citation Title ANALYSIS AND DEMONSTRATION OF DIAGNOSTIC PERFORMANCE IN MODERN ELECTRONIC SYSTEMS. Author(s) Weiss, Jerold L.; Deckert, James C.; Kelly, Kevin B. Corporate Author(s) ALPHATECH INC BURLINGTON MA Report Date 8/1/1991 Page Count 204 Abstract This report presents methods and procedures for validation anddemonstration of diagnostic system performance for use as part of theGovernment's acceptance test procedures for electronic systems havingcontractual diagnostic requirements. These methods provide for examining theadequacy of the diagnostics architecture, establishing bounds on fraction offaults detected (FFD) and fraction of faults isolated (FFI) (the only twofigures of merit considered here), and choosing faults to be inserted in thedemonstration, but fall short of confirming exact values for FFD and FFI. Thecurrent state-of-the-art does not support an exact determination of FFD and FFIfor new equipment, especially that containing higher density VLSI and VHSICelectronic devices, because of the inability to determine the failure rates forthe various failure modes, and the difficulty in inserting a truly random sampleof faults. Price: Available from National Technical Information Service (NTIS). http://www.ntis.gov   Prices are plus sales tax when purchased within New York State and shipping charges, if applicable