Virtual Bookstore Citation Title MICROCIRCUIT DEVICE RELIABILITY HYBRID CIRCUIT DATA, WINTER 1979/1980, Author(s) Flint,Steven J. ; Corporate Author(s) IIT RESEARCH INST ROME N Y Report Date 1/1/1980 Page Count 304 Abstract This compendium of Hybrid Microcircuit Reliability Data contains bothdetailed and summarized information. The detailed data have been collected fromboth military and commercial applications and consist of field experience,reliability demonstration results, screening fallout, life tests, and equipmentcheck-out results. A full description of the construction of each device as wellas the manufacturer and all test parameters have been included. The summarizeddata show the distribution of failure causes for hybrids subjected to variousconditions, failure rates of components used within hybrids, the screeningfallout distributions and a comparison between field data and MIL-HDBK-217predictions. (Author) Price: Available from National Technical Information Service (NTIS). http://www.ntis.gov   Prices are plus sales tax when purchased within New York State and shipping charges, if applicable