Virtual Bookstore Citation Title QUALITY, RELIABILITY AND STRESS TESTING Author(s) EVANS,JERRY E. ; Corporate Author(s) Report Date 1/1/1984 Page Count 5 Abstract a tutorial introduction to the field of accelerated stress testing forintegrated circuits is presented. the definition of the terms quality andreliability as used in industry is followed by an introduction to thetheoretical basis of accelerated stress testing. the modifications of the basicequations to determine acceleration factors for several different stress factors(temperature, current and voltage) are given. the requirements of test equipmentin the areas of high temperature materials and voltage and current forcingaccuracy considerations are presented. (author) Out Of Print Prices are plus sales tax when purchased within New York State and shipping charges, if applicable