|Virtual Bookstore Citation|
PULSE RADIATION RELIABILITY OF PASSIVE ELECTRONIC PARTS,
Lascaro,C. P. ;Schlosser,W. ;
The current state of the art of the testing and rating the reliabilityof selected electronic parts is limited by the complexity and difficultiesinherent in pulsed radiation testing procedures. Data on which to base arelative reliability index exist only for capacitors, resistors, cables, memorycores and tapes. Such data are being utilized in prediction techniques which areused to calculate electronic circuit performance in a nuclear radiationenvironment. Good correlation has been obtained with field studies. (Author).
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