|Virtual Bookstore Citation|
VLSI (VERY LARGE SCALE INTEGRATED CIRCUITS) DEVICE RELIABILITY MODELS.
Coit,D. ;Denson,W. ;Key,K. ;Flint,S. ;Turkowski,W. ;
IIT RESEARCH INST CHICAGO IL
This report details a study in which the objective was to developfailure rate prediction models for VLSI, Hybrid, analog microprocessor, andVHSIC devices. A description is given of the various phases involved inreliability prediction model development, su
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